Tera Probe, Inc. is engaged in the wafer testing, final testing and test engineering for semiconductor devices. Its operations are carried out through the following divisions: Test Operations and Test Development. The Test Operations division conducts testing and test related services for dynamic random access memory (DRAM), system on a chip (SoC), image sensors and analogs. The Test Development division includes conversion of test programs and test patterns. It also designs and develops probe cards and mass production set up. The company was founded on August 4, 2005 and is headquartered in Yokohama, Japan.
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